Amir Ali Ahmadi, Raphaël M. Jungers, et al.
SICON
No abstract available.
Amir Ali Ahmadi, Raphaël M. Jungers, et al.
SICON
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, et al.
SPIE Photomask Technology + EUV Lithography 2009
F. Odeh, I. Tadjbakhsh
Archive for Rational Mechanics and Analysis
Da-Ke He, Ashish Jagmohan, et al.
ISIT 2007