P.E. Batson, J.F. Morar
Physical Review Letters
The system of computer control of STEM operation for EELS acquisition is described. The ability to obtain analytical information from 1 nm sized areas during a 15 min integration time is illustrated. The system of hardware and software is discussed in general terms to highlight the organizational philosophy which allows complex and adaptable behavior with a minimum of construction effort. © 1982.
P.E. Batson, J.F. Morar
Physical Review Letters
P.E. Batson, T.M. Shaw, et al.
Physical Review B
P.E. Batson
Review of Scientific Instruments
S. Subramanian, D.A. Muller, et al.
Materials Science and Engineering A