Conference paper
Symmetry-selected electron energy loss scattering
P.E. Batson
MSA Annual Meeting 1993
The system of computer control of STEM operation for EELS acquisition is described. The ability to obtain analytical information from 1 nm sized areas during a 15 min integration time is illustrated. The system of hardware and software is discussed in general terms to highlight the organizational philosophy which allows complex and adaptable behavior with a minimum of construction effort. © 1982.
P.E. Batson
MSA Annual Meeting 1993
P.E. Batson
Physical Review B
P.E. Batson
Ultramicroscopy
C.C. Tsuei, A. Gupta, et al.
Science