P.E. Batson
Ultramicroscopy
The system of computer control of STEM operation for EELS acquisition is described. The ability to obtain analytical information from 1 nm sized areas during a 15 min integration time is illustrated. The system of hardware and software is discussed in general terms to highlight the organizational philosophy which allows complex and adaptable behavior with a minimum of construction effort. © 1982.
P.E. Batson
Ultramicroscopy
J. Bruley, P.E. Batson
Physical Review B
P.E. Batson
MSA Annual Meeting 1993
P.E. Batson, K.L. Kavanagh, et al.
Ultramicroscopy