P.E. Batson
Review of Scientific Instruments
The system of computer control of STEM operation for EELS acquisition is described. The ability to obtain analytical information from 1 nm sized areas during a 15 min integration time is illustrated. The system of hardware and software is discussed in general terms to highlight the organizational philosophy which allows complex and adaptable behavior with a minimum of construction effort. © 1982.
P.E. Batson
Review of Scientific Instruments
A.C. Callegari, K. Babich, et al.
ECS Meeting 2007
P.E. Batson
Ultramicroscopy
P.E. Batson, T.M. Shaw, et al.
Physical Review B