Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
A theoretical approach in computing the index of a Morse function at a critical point on a real non-singular hypersurface V is given. As a consequence the Euler characteristic of V is computed. In the case where the hypersurface is polynomial and compact, a procedure is given that finds a linear function l, whose restriction l∣v, is a Morse function on V. © 1988, Hindawi Publishing Corporation. All rights reserved.