Mark W. Dowley
Solid State Communications
In situ evaporated polycrystalline Yb films at different substrate temperatures (10<T<∼300 K) were studied by surface-sensitive photoemission (h =40.8 eV). The presence of substrcture in the surface-derived 4f13 components allowed an identification of multiple surface shifts as being due to different coordination numbers of surface atoms. The temperature- dependent intensity variation of the surface emission could be correlated with the temperature-dependent change of the surface microstructure. © 1983 The American Physical Society.
Mark W. Dowley
Solid State Communications
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990