About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
ICPS Physics of Semiconductors 1984
Conference paper
TEMPERATURE AND ELECTRIC FIELD DEPENDENCE OF HOPPING CONDUCTION IN A TWO DIMENSIONAL IMPURITY BAND.
Abstract
For electric fields in which the current-field characteristic is ohmic (F congruent 0. 4 v/cm), the dc conductivity associated with a sodium impurity band in a silicon MOSFET has been found experimentally to be consistent with a given formula. The correspondence between the observations on sodium impurity bands and the predictions of the theory for a two dimensional random system indicates that the low temperature ohmic conductivity in the impurity band is determined by hopping between localized states. For electric fields F greater than 10 v/cm, we have observed nonohmic conductivity over the temperature range. Since the chemical potential lies well below the conduction band ( mu less than E//c) and the temperature is low (k//BT less than E//c), we assume that the nonohmic conduction is associated with a hopping mechanism.