Publication
Review of Scientific Instruments
Paper

Synthesis of diffraction line profiles from continuous scanning data

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Abstract

Two methods have been developed for synthesizing diffraction line profiles from continuous scanning data. The first method uses numerical analysis where segments of profiles are approximated by one or more polynomials. The second method employs Fourier analysis to obtain the Fourier coefficients of the diffraction profile from continuous scanning data. Examples of application are discussed. © 1970 The American Institute of Physics.

Date

11 Nov 2003

Publication

Review of Scientific Instruments

Authors

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