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Paper
Synthesis of diffraction line profiles from continuous scanning data
Abstract
Two methods have been developed for synthesizing diffraction line profiles from continuous scanning data. The first method uses numerical analysis where segments of profiles are approximated by one or more polynomials. The second method employs Fourier analysis to obtain the Fourier coefficients of the diffraction profile from continuous scanning data. Examples of application are discussed. © 1970 The American Institute of Physics.