Summary abstract: On the quantitative aspects of oxygen enhancement in secondary ion mass spectrometry

P.C. Pattnaik, D.M. Newns

Physical Review B

R.J. Gambino, N.R. Stemple, et al.

Journal of Physics and Chemistry of Solids

P. Martensson, R.M. Feenstra

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Robert W. Keyes

Physical Review B