Summary Abstract: Analysis of Co-doped iron oxide thin films by grazing incidence x-ray diffraction

Corneliu Constantinescu

SPIE Optical Engineering + Applications 2009

M.A. Lutz, R.M. Feenstra, et al.

Surface Science

Joy Y. Cheng, Daniel P. Sanders, et al.

SPIE Advanced Lithography 2008

S. Cohen, T.O. Sedgwick, et al.

MRS Proceedings 1983