Structural properties of high Tc epitaxial Y1Ba2Cu3Ox thin films

Abstract

Epitaxial high Tc Y1Ba2Cu3Ox thin films have been produced on SrTiO3(110) substrates by off-axis DC magnetron sputtering and oxygen anneal which have transition temperatures(R= 0) of 87 K. We have characterized the structural properties of these films using Bragg diffraction, grazing incidence diffraction and rocking curve X-ray characterization techniques along with TEM diffraction and lattice imaging which verified that these films are epitaxial in nature and not epiaxial or poly-epi. The c-axis lies in the plane of the substrate with the [1-10] direction also in the plane and normal to the c-axis; the [110] direction lies normal to the film surface. SEM and EMPA results have also been obtained on these films indicating that the main defect mechanisms are second phase precipitates that form at the surface during the anneal and microcracks that are perpendicular to the c-axis. © 1989.