Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020
The morphology and structure of sputtered Ta/Co/Ta thin-film sandwiches were investigated by cross-sectional high-resolution transmission electron microscopy. Although the Co layer shows an overall 〈111〉-oriented fcc structure, a high density of hcp stacking faults in present in the layer. The Co structure can thus be described as a random distribution of hcp stacking sequences in an overall fcc structure. © 1995.
Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
P. Alnot, D.J. Auerbach, et al.
Surface Science
Hiroshi Ito, Reinhold Schwalm
JES