P. Alnot, D.J. Auerbach, et al.
Surface Science
The morphology and structure of sputtered Ta/Co/Ta thin-film sandwiches were investigated by cross-sectional high-resolution transmission electron microscopy. Although the Co layer shows an overall 〈111〉-oriented fcc structure, a high density of hcp stacking faults in present in the layer. The Co structure can thus be described as a random distribution of hcp stacking sequences in an overall fcc structure. © 1995.
P. Alnot, D.J. Auerbach, et al.
Surface Science
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures
P.C. Pattnaik, D.M. Newns
Physical Review B