Publication
DRC 1999
Paper

Straddle gate transistors: High Ion/Ioff transistors at short gate lengths

Abstract

A straddle geometry which allows electric control of the effective channel length, an improvement in Ion/Ioff ratio, and low power transistors at gate-lengths well below 30 nm, is presented. These are obtained experimentally and theoretically not limited by the constraints of shallow doping extensions.

Date

Publication

DRC 1999

Authors

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