Publication
Journal of Applied Physics
Paper

Specimen replication for electron microscopy using x rays and x-ray resist

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Abstract

We point out the advantages of the use of x-ray resist as the recording medium in contact x-ray micrography, with subsequent viewing under the scanning electron microscope. Untreated specimens may be replicated with a resolution better than 100 nm. Photographs of latex spheres obtained by this technique are presented.

Date

28 Aug 2008

Publication

Journal of Applied Physics

Authors

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