Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
The purpose of this note is to describe recent progress made in understanding the box spline. © 1984 American Mathematical Society.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Minghong Fang, Zifan Zhang, et al.
CCS 2024
Heinz Koeppl, Marc Hafner, et al.
BMC Bioinformatics
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009