Jon Lee
Computers and Operations Research
We present a practical approach to Anstreicher and Lee's masked spectral bound for maximum-entropy sampling, and we describe favorable results that we have obtained with a Branch-and-Bound algorithm based on our approach. By representing masks in factored form, we are able to easily satisfy a semidefiniteness constraint. Moreover, this representation allows us to restrict the rank of the mask as a means for attempting to practically incorporate second-order information. © Springer-Verlag 2007.
Jon Lee
Computers and Operations Research
Vijay S. Iyengar, Jon Lee, et al.
ACM Conference on Electronic Commerce 2001
Sonia Cafieri, Jon Lee, et al.
Journal of Global Optimization
Yael Berstein, Jon Lee, et al.
SIAM Journal on Discrete Mathematics