Simulation of embedded memories by defective hashing

Abstract

Because logic designs are becoming more complex and extensive, they increasingly tend to contain embedded memories. In the simulation (particularly fault simulation) of these designs, the embedded memories may be found to require large amounts of storage unless a carefully designed simulation strategy is adopted. This paper describes a technique that drastically reduces the storage required in the fault simulation of such large designs. The required amount of storage can be fixed at compile time or at load time, and can almost always be made to fit in the available storage at the cost of only a small decrease in the predicted exposure probabilities.