Yu-Ming Lin, Hsin-Ying Chiu, et al.
IEEE Electron Device Letters
Silicon-Germanium (SiGe) power heterojunction bipolar transistors (HBT's) are fabricated by using two or ten device unit cells with an emitter area of 5 × 0.5 × 16.5 μm 2 each. The large power transistor features 1 W rf output power at 3-dB gain compression, 3.5 V bias, and 2.4 GHz with a maximum power-added-efficiency (PAE) of 48% for Class A/B operation. At a supply voltage of 1.5 V, the transistor delivers a 3-dB rf output power of 150 mW with a PAE of 47%. It is shown that a high collector doping level is advantageous for low-voltage operation. Further, by using special bias sense ports, the interconnect losses are found to degrade the device performance to a considerable degree.
Yu-Ming Lin, Hsin-Ying Chiu, et al.
IEEE Electron Device Letters
Stas Polonsky, Keith A. Jenkins
ISDRS 2003
Joachim N. Burghartz, Mehmet Soyuer, et al.
IEEE Transactions on Electron Devices
Keith A. Jenkins, John D. Cressler
IEEE T-ED