J.E. Demuth, D.E. Eastman
Physical Review B
Scanning tunneling microscopy has been used to determine the atomic structure of the clean Si(001) surface. The basic structural unit of the reconstruction has been resolved with a lateral resolution of 1/4 3. Buckled and nonbuckled dimers appear to be present in roughly equal amounts, indicating that they have nearly the same energy. The presence of atomic-scale defects is discussed. © 1985 The American Physical Society.
J.E. Demuth, D.E. Eastman
Physical Review B
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