L. Novotny, D. Pohl, et al.
Journal of the Optical Society of America A: Optics and Image Science, and Vision
In certain problems of electrical transport through condensed matter, it is important to know the potential distribution with microscopic resolution, e.g., at interfaces (Schottky barriers) or pn junctions. Scanning tunneling potentiometry, a new application of scanning tunneling microscopy, is capable of providing this information. The tunnel current is used for simultaneously sensing probe-to-sample distance and local potential. The method was tested with a gold-island metal-insulator-metal structure.
L. Novotny, D. Pohl, et al.
Journal of the Optical Society of America A: Optics and Image Science, and Vision
U.Ch. Fischer, D. Pohl
Physical Review Letters
P. Muralt, H.P. Meier, et al.
Superlattices and Microstructures
D. Pohl
Institute of Physics Electron Microscopy and Analysis Group Conference 1991