A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Paper
Scanning tunneling microscopy: a surface science tool and beyond
Abstract
A short overview of the history of scanning tunneling microscopy and the principle of local probe methods is given. A selection of applications illustrates the unique and attractive features and the wide interdisciplinary nature of local probe methods. They could be the beginning of a new era in surface science. © 1994.
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