J.R. Barnes, R.J. Stephenson, et al.
Review of Scientific Instruments
A brief review of the state-of-the-art of scanning tunneling microscopy (STM) is presented with emphasis on materials problems. I shall discuss in particular the variety of materials, environments and temperatures that can be investigated. In addition to topographic studies, some examples of STM as local probe are given. It is proposed that STM be increasingly incorporated as a technique for investigation of real materials problems.
J.R. Barnes, R.J. Stephenson, et al.
Review of Scientific Instruments
D. Pohl, J.K. Gimzewski
Optics in Complex Systems 1990
J.K. Sass, J.K. Gimzewski
Journal of Electroanalytical Chemistry
J.K. Gimzewski, T.A. Jung, et al.
Surface Science