H. Rohrer
Japanese Journal of Applied Physics
An overview of the status of Scanning Tunneling Microscopy (STM) is given. So far, the method has been applied mainly to surface structures. Examples are given for reconstructions on metal and semiconductor surfaces and adsorbate structures. It will become evident that the technique is likewise applicable to chemical investigations of surfaces on an atomic scale. © 1984 Elsevier Science Publishers B.V.
H. Rohrer
Japanese Journal of Applied Physics
M.I. Lutwyche, C. Andreoli, et al.
MEMS 1998
G. Binnig, H. Rohrer
ICPS Physics of Semiconductors 1984
K.W. Blazey, H. Rohrer
Physical Review