Conference paper
SCANNING TUNNELING MICROSCOPY.
G. Binnig, H. Rohrer
ICPS Physics of Semiconductors 1984
An overview of the status of Scanning Tunneling Microscopy (STM) is given. So far, the method has been applied mainly to surface structures. Examples are given for reconstructions on metal and semiconductor surfaces and adsorbate structures. It will become evident that the technique is likewise applicable to chemical investigations of surfaces on an atomic scale. © 1984 Elsevier Science Publishers B.V.
G. Binnig, H. Rohrer
ICPS Physics of Semiconductors 1984
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