Variability analysis for sub-100 nm PD/SOI CMOS SRAM cell
Rajiv V. Joshi, Saibal Mukhopadhyay, et al.
ESSCIRC 2004
This paper describes the design and hardware results of a scannable pulse-to-static conversion register array for self-timed circuits. The circuits include a self-timed control circuit and a 64-bit register array, both designed utilizing self-resetting CMOS (SRCMOS) circuit techniques. The self-timed feature of the control block allows it to require only one system clock input. The evaluation, reset, and write-enable controls are all generated within the control macro. The register array is a level-sensitive scan design, which is compatible and complies with SRCMOS test modes. This type of register array can facilitate the synchronous/asynchronous interfaces, pipelined operation, power management, and testing of advanced digital systems employing a mixture of static and dynamic circuits to achieve low power and high performance.
Rajiv V. Joshi, Saibal Mukhopadhyay, et al.
ESSCIRC 2004
Mohammad Amin Yaldagard, Sumit Diware, et al.
AICAS 2023
Hamed F. Dadgour, Rajiv V. Joshi, et al.
DAC 2006
Nicky C.C. Lu, Gary B. Bronner, et al.
IEEE Journal of Solid-State Circuits