Ellen J. Yoffa, David Adler
Physical Review B
We present an introduction to resonant inelastic soft X-ray scattering (RIXS) spectroscopy as a tool to obtain bandstructure information in broad band solids.
Ellen J. Yoffa, David Adler
Physical Review B
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP