Resonant inelastic soft X-ray scattering as a bandstructure probe: A primer

S. Eisebitt; J. Lüning; J.-E. Rubensson; W. Eberhardt

doi:10.1002/(SICI)1521-3951(199909)215:1&lt;803::AID-PSSB803&gt;3.0.CO;2-O

physica status solidi (b)

Paper

01 Jan 1999

Resonant inelastic soft X-ray scattering as a bandstructure probe: A primer

View publication

Abstract

We present an introduction to resonant inelastic soft X-ray scattering (RIXS) spectroscopy as a tool to obtain bandstructure information in broad band solids.

Paper

Structural and magnetic properties of Cr and Mn doped InN

A. Ney, R. Rajaram, et al.

Journal of Magnetism and Magnetic Materials

Paper

Stress-induced roughening in epitaxial growth

J. Tersoff

Applied Surface Science

Paper

“Dirty” Displacive Ferroelectrics

E. Burstein

Ferroelectrics

Paper

On Fitting Error Functions to Data

R. Ghez, M.B. Small

JES

View all publications

Abstract

Related

Structural and magnetic properties of Cr and Mn doped InN

Stress-induced roughening in epitaxial growth

“Dirty” Displacive Ferroelectrics

On Fitting Error Functions to Data