F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
We present an introduction to resonant inelastic soft X-ray scattering (RIXS) spectroscopy as a tool to obtain bandstructure information in broad band solids.
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
R. Ghez, M.B. Small
JES