William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
The graphitelike model recently proposed by Jones and Holland for the structure of a laser-stabilized Si{111}1×1 surface is subjected to a new low-energy electron-diffraction (LEED) intensity analysis and compared to the relaxed-bulk model produced by earlier LEED analyses. Three different reliability factors applied to the normal-incidence data, and visual evaluation of non-normal-incidence data, discriminate unambiguously in favor of the relaxed-bulk model against the graphitelike model. © 1986 The American Physical Society.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
Julien Autebert, Aditya Kashyap, et al.
Langmuir