Journal of Microscopy

Paper

02 Aug 2011

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

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Abstract

No abstract available.

Paper

Some theoretical aspects of type‐1 magnetic contrast in the scanning electron microscope

Oliver C. Wells

Journal of Microscopy

Conference paper

Past, present, and future of backscatter electron (BSE) imaging

Oliver C. Wells, Michael S. Gordon, et al.

ScMi 2012

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Method for measuring the field from a magnetic recording head in the scanning electron microscope

Oliver C. Wells

Journal of Microscopy

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XY table and tilting stage for scanning electron microscope (SEM)

Oliver C. Wells

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