PaperApplication of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samplesOliver C. Wells, Maurice McGlashan-Powell, et al.Scanning
PaperExamining deep holes by rocking the beam in the scanning electron microscopeOliver C. WellsReview of Scientific Instruments
PaperMagnetic Domains in Thin-Film Recording Heads as Observed in the SEM by a Lock-In TechniqueOliver C. Wells, Richard J. SavoyIEEE Transactions on Magnetics
