Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
The present status of ellipsometric measurement capability is reviewed. Significant advances since the last ellipsometry conference are highlighted. © 1980.
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Mitsuru Ueda, Hideharu Mori, et al.
Journal of Polymer Science Part A: Polymer Chemistry