L. Su, R. Schulz, et al.
VLSI Technology 1998
A device is presented that sweeps out programmable optical delays of 300 ps (or less) at 30 Hz, with shorter-delay scans possible at much higher rates. It is compact, vibration-free, linear to within 0.02%, and has a position repeatability of 1 part in 105. With this scanner and a PC-based signal-averaging data acquisition system, ultrafast autocorrelation measurements with very high signal/noise are demonstrated in both the fs and ps domains.
L. Su, R. Schulz, et al.
VLSI Technology 1998
R.A. Kiehl, P.E. Batson, et al.
Physical Review B
C.-C. Yang, Fenton R. McFeely, et al.
IEEE Electron Device Letters
A. Deutsch, H. Smith, et al.
IEEE Topical Meeting EPEPS 1999