Ruixiong Tian, Zhe Xiang, et al.
Qinghua Daxue Xuebao/Journal of Tsinghua University
Many VLSI circuits to which WR might be applied exhibit a regular, symmetric structure. For such circuits, general spectral estimates of the convergence rate are not necessarily very accurate. By relying on a detailed analysis of the system structure, estimates for the convergence of the waveform relaxation method are given for RC circuits arising as simplified models of a VLSI interconnect. These examples suggest a new approach to WR convergence estimation. © 1993.
Ruixiong Tian, Zhe Xiang, et al.
Qinghua Daxue Xuebao/Journal of Tsinghua University
T. Graham, A. Afzali, et al.
Microlithography 2000
Jonathan Ashley, Brian Marcus, et al.
Ergodic Theory and Dynamical Systems
Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011