Juliann Opitz, Robert D. Allen, et al.
Microlithography 1998
Many VLSI circuits to which WR might be applied exhibit a regular, symmetric structure. For such circuits, general spectral estimates of the convergence rate are not necessarily very accurate. By relying on a detailed analysis of the system structure, estimates for the convergence of the waveform relaxation method are given for RC circuits arising as simplified models of a VLSI interconnect. These examples suggest a new approach to WR convergence estimation. © 1993.
Juliann Opitz, Robert D. Allen, et al.
Microlithography 1998
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
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Journal of Cryptology
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Microlithography 2003