Raman scattering from H or O terminated porous Si

J.C. Tsang; M.A. Tischler; R.T. Collins

doi:10.1063/1.107054

Applied Physics Letters

Paper

01 Dec 1992

Raman scattering from H or O terminated porous Si

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Abstract

The dependence of the crystalline structure of porous Si on the bonding of surface Si atoms to either H or O has been studied by Raman spectroscopy. H terminated porous Si shows microcrystalline character while O terminated porous Si shows atomic disorder within the Si particles.

Conference paper