Subramanian S. Iyer, K. Eberl, et al.
Applied Physics Letters
Paper
Raman scattering from H or O terminated porous Si
Abstract
The dependence of the crystalline structure of porous Si on the bonding of surface Si atoms to either H or O has been studied by Raman spectroscopy. H terminated porous Si shows microcrystalline character while O terminated porous Si shows atomic disorder within the Si particles.
Related
T. Mueller, F. Xia, et al.
Physical Review B - CMMP
J.C. Tsang
Solid State Communications
T.F. Kuech, M.A. Tischler, et al.
Applied Physics Letters