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Microelectronic Engineering
We have used photoluminescence from nonequilibrium electrons recombining at neutral acceptors to quantitatively measure hot electron kinetics in GaAs. Values have been obtained for intervalley scattering rates as a function of electron kinetic energy and the scattering rate of a single nonequilibrium electron in the presence of a sea of thermalized carriers. These measurements demonstrate the power of this new probe of nonequilibrium carrier relaxation in direct gap semiconductors. © 1989.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
Robert W. Keyes
Physical Review B
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano