J. Quinn, Y.S. Li, et al.
Physical Review B
Paper
Pyrometric measurements of si, ge, and gaas wafers between 100°and 700°c
Abstract
No abstract available.
Related
R.F. Peart, F. Jona, et al.
Journal of Applied Physics
D. Sondericker, F. Jona, et al.
Physical Review B
R.F. Lever, H.R. Wendt
Surface Science