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IEEE TNS
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Pion-induced soft upsets in 16 Mbit DRAM chips

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Abstract

Measurements of the soft upset cross section due to energetic charged pions were made in various 16 Mbit memory chips, as a function of incident pion energy and for chips with different cell technologies. Significant differences are seen to exist between cell technologies, up to a factor of 1000 in cross section. Upset cross sections are reported that exhibit proportionality to the reaction cross section for pions on silicon, including the well-known enhancement over proton and neutron cross sections near the delta resonance. Implications of this enhancement for pion-induced upsets due to cosmic ray fluxes are discussed. © 1997 IEEE.

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IEEE TNS

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