The DX centre
T.N. Morgan
Semiconductor Science and Technology
A multiple-wavenumber analysis method for scanned-angle photoelectron holography is refined to image the near-surface atoms at a Cu(001) crystal face. The atoms one layer above the emitter are imaged at the appropriate location although shifted by 0.2Å. To strengthen this analysis, a comparison is made with a simple model which gives a similar result. A theoretical study is also presented that demonstrates why a holographic analysis scheme for scanned-angle diffraction patterns tends to preferentially image forward scattering atoms unlike scanned-energy variants of holographic atom imaging. © 1995.
T.N. Morgan
Semiconductor Science and Technology
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids