A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
A multiple-wavenumber analysis method for scanned-angle photoelectron holography is refined to image the near-surface atoms at a Cu(001) crystal face. The atoms one layer above the emitter are imaged at the appropriate location although shifted by 0.2Å. To strengthen this analysis, a comparison is made with a simple model which gives a similar result. A theoretical study is also presented that demonstrates why a holographic analysis scheme for scanned-angle diffraction patterns tends to preferentially image forward scattering atoms unlike scanned-energy variants of holographic atom imaging. © 1995.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
J.J. Barton
Physical Review Letters
Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020
Ellen J. Yoffa, David Adler
Physical Review B