William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Photoelectron angular distribution patterns from a single-crystal Cu(001) surface have produced dips, or ''silhouettes,'' in the low-energy, electron angular distribution measured around normal emission-a forward-scattering geometry that at higher energy produces a peak, or enhancement, in electron intensity. We have measured isoenergetic l=1 and l=2,0 photoelectrons that give different angular distribution patterns. These differences, and the low-energy electron intensity attenuation, are consistent with an electron scattering model that relies on the orbital angular momentum final-state dependence of the diffracting electron. © 1993 The American Physical Society.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
J.A. Barker, D. Henderson, et al.
Molecular Physics
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics