V. Novotny, J.D. Swalen, et al.
Langmuir
The refractive indices of thin dielectric films on the surface of an optical waveguide were determined from the mode patterns, i.e., effective indices in the guide as a function of selected visible laser wavelengths. These more accurate results are compared with previous measurements and illustrate the advantages of this method. © 1978.
V. Novotny, J.D. Swalen, et al.
Langmuir
J.D. Swalen
Thin Solid Films
J.D. Swalen
Journal of Physical Chemistry
Jean Francois Tassin, R.L. Siemens, et al.
Journal of Physical Chemistry