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The refractive indices of thin dielectric films on the surface of an optical waveguide were determined from the mode patterns, i.e., effective indices in the guide as a function of selected visible laser wavelengths. These more accurate results are compared with previous measurements and illustrate the advantages of this method. © 1978.
Barton A. Smith, S. Herminghaus, et al.
SPIE San Diego 1991
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