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Publication
IEEE ITC 2003
Conference paper
Optical and Electrical Testing of Latchup in I/O Interface Circuits
Abstract
Optical and electrical testing of latchup in Inputs/Outputs (I/O) interface circuits was presented. The circuit structures and devices that were most prone to latchup were first localized and then identified. The effect of nearby logic circuitry, n-well substrate contact periodicity and temperature on the ignition of latchup was examined.