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Characterization of a next generation step-and-scan system
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SPIE Advanced Lithography 1998
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On the validity of vortex-tangle simulations of homogeneous superfluid turbulence
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Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
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IEEE Transactions on Pattern Analysis and Machine Intelligence
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Surface light-induced changes in thin polymer films
Andrew Skumanich
SPIE Optics Quebec 1993