Conference paper
Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
A finite test set for an integer optimization problem enables us to verify whether a feasible point attains the global optimum. In this paper, we establish several general results that apply to integer optimization problems with nonlinear objective functions. © 2008 Elsevier B.V. All rights reserved.
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
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SCC 2007
Leo Liberti, James Ostrowski
Journal of Global Optimization
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SPIE Photomask Technology + EUV Lithography 2011