PaperA technique for comparing the bulk and surface structure of defects in thin films using the scanning transmission electron microscope.M.M.J. Treacy, W. Krakow, et al.Applied Physics Letters
PaperElectron beam evaporation of oriented Nb films onto GaAs crystals in ultrahigh vacuumM. Eizenberg, D.A. Smith, et al.Applied Physics Letters
PaperComparison between the invariant line and structural ledge theories for predicting the habit plane, orientation relationship and interphase boundary structure of plate-shaped precipitatesJ.M. Howe, D.A. SmithActa Metallurgica Et Materialia
PaperSelection of solutes for improving electromigration resistance of metals: A new insightM.B. Small, D.A. SmithApplied Physics Letters
