Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
No abstract available.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
Heinz Koeppl, Marc Hafner, et al.
BMC Bioinformatics
Jonathan Ashley, Brian Marcus, et al.
Ergodic Theory and Dynamical Systems