Off resonance ac mode force spectroscopy and imaging with an atomic force microscope

Abstract

Using an off resonance ac technique in ultrahigh vacuum we have directly measured the force-gradient interaction characteristics of a gold tip and sample and demonstrated a new atomic force microscope imaging mode with the tip located very close to the surface. The method involves the application of a small sinusoidal oscillating force to the tip via a magnetic field created by a conducting coil which interacts with a magnetic particle glued on the backside of the cantilever. By measuring the change in amplitude during the approach and retraction of the sample we have a continuous and accurate measure of the force gradient. The interaction potential is thus found without the need for complex analysis as is necessary in the case of the commonly used technique of measuring frequency shifts.