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Publication
Proceedings of SPIE 1989
Conference paper
Oblique viewing attachment for microscope
Abstract
The microscopic examination of a planar sample in an oblique manner is proved to be feasible, indeed easy, using in conjunction with a microscope a simple attachment consisting of a unity magnification system and a diffraction grating. The illumination must be monochromatic. The unity magnification system focuses the sample onto the grating. The grating is chosen such that the first diffracted order corresponding to the incidence used in the arrangement is perpendicular to the grating. The grating is observed with the microscope in the conventional manner. The principle, properties, capabilities and limitations of this novel and versatile optical arrangement are explained and reviewed. © 1983 SPIE.