Yuhai Tu, J. Tersoff, et al.
Physical Review Letters
A solid-on-solid interface representation of the random-field Ising model is studied numerically in two dimensions. The interface width varies linearly with sample size, in agreement with simple energy-accounting arguments and recent theories which predict that two is the lower critical dimension of the random-field Ising model. © 1983 The American Physical Society.
Yuhai Tu, J. Tersoff, et al.
Physical Review Letters
G. Grinstein, D. Mukamel
Journal of Physics A: Mathematical and General
G. Grinstein, D. Mukamel
Physical Review B
T.A.L. Ziman, D.J. Amit, et al.
Physical Review B