Conference paper
HIGH RESOLUTION THERMAL MICROSCOPY.
C.C. Williams, H.K. Wickramasinghe
IUS 1985
A new technique is described whereby one can extract the nonlinear photothermal properties of a sample in photothermal microscopy. The basic scheme relies on chopping a pump heating beam at ω and detecting the temperature variation of the sample using a linear temperature sensor (in our case a mirage detector) tuned to 2ω. Harmonic images of cracks and other samples show very high contrast when compared with the fundamental image.
C.C. Williams, H.K. Wickramasinghe
IUS 1985
C.C. Williams, H.K. Wickramasinghe
Journal of Applied Physics
H.K. Wickramasinghe
Proceedings of SPIE 1989
C.W. See, M. Vaez Iravani, et al.
Applied Optics