Philip C. D. Hobbs, David W. Abraham, et al.
Applied Physics Letters
A new technique is described whereby one can extract the nonlinear photothermal properties of a sample in photothermal microscopy. The basic scheme relies on chopping a pump heating beam at ω and detecting the temperature variation of the sample using a linear temperature sensor (in our case a mirage detector) tuned to 2ω. Harmonic images of cracks and other samples show very high contrast when compared with the fundamental image.
Philip C. D. Hobbs, David W. Abraham, et al.
Applied Physics Letters
C.C. Williams, J. Slinkman, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
C.C. Williams, H.K. Wickramasinghe
SPIE OE/LASE 1988
Y. Martin, S. Rishton, et al.
Applied Physics Letters