Publication
IEEE Transactions on Magnetics
Paper

Noise margins for Josephson logic and memory devices

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Abstract

Noise which can produce erroneous transitions in Josephson logic devices can be treated in terms of the familiar model for thermal activation of a particle over a potential barrier. Noise curves are calculated which represent the effective threshold curves for a given transition rate; this approach can be applied to the mode-to-mode (superconducting) transitions as well as to the mode-to-voltage state switching. The analysis will be illustrated with the example of a three-junction current injection device. The practical consequences for design of Josephson, logic circuits will be indicated. © 1983 IEEE

Date

01 Jan 1983

Publication

IEEE Transactions on Magnetics

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