A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
In data storage devices, several types of errors may occur. This includes random errors as well as burst errors of different lengths. a class of error-control codes is presented, based on a multilevel coding architecture, that can correct several types of errors. The parameters of the multilevel codes can be adjusted to match the probability of each error type. The decoding algorithms of these codes allow for fast-error recovery since they are based on decoding algorithms of simpler codes. a class of multilevel codes is constructed, based on Reed-Solomon codes, whose redundancy is minimal. © 1991 IEEE.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997
Preeti Malakar, Thomas George, et al.
SC 2012
J.P. Locquet, J. Perret, et al.
SPIE Optical Science, Engineering, and Instrumentation 1998