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Publication
ICCD 1994
Conference paper
Multifault testable circuits based on binary parity diagrams
Abstract
In this paper we introduce a new class of binary graphs called Binary Parity Diagrams (BPDs). Ordered Binary Parity Diagram of a function is canonical. Importance of canonical forms in circuit verification is well known. Circuits derived on the basis of these diagrams are multifault testable. In this paper we focus on multifault testability property.