Michael. S. Gordon, Kenneth P. Rodbell, et al.
IEEE TNS
Novel techniques have been applied to model realistic alpha particle source distributions in complex back-end-of-the-line geometries. Rigorous Monte Carlo simulations with high resolution have been performed to analyze the charge collection in 45 nm SOI test devices. These studies reveal soft fail sensitivity to the topologies of the alpha particle source and the BEOL structure. © 2009 IEEE.
Michael. S. Gordon, Kenneth P. Rodbell, et al.
IEEE TNS
Andrew J. Ying, Conal E. Murray, et al.
Journal of Applied Crystallography
Mary Y. Lanzerotti, Giovanni Fiorenza, et al.
IEEE Transactions on VLSI Systems
R.A. Reed, R.A. Weller, et al.
IEEE TNS