Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Kumar and Sorbello have expressed the effective force on an ion in electromigration in terms of a response function, which is evaluated here by the method of quantum field theory. Formulas for the force are derived for the jellium model and for a crystal lattice. Some physical insight can be gained by viewing previous works on this subject through this particular perspective. © 1975 The American Physical Society.
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings