Michiel Sprik
Journal of Physics Condensed Matter
The Lorenz-polarization (LP) factor, which is used for X-ray intensity calculations from polycrystalline materials, contains a term that describes the fraction of diffracting grains in the irradiated sample volume. We present extensions of this term and a series of experiments that tests its applicability. The implications of the analysis on microbeam diffraction are also discussed. © 2004 International Centre for Diffraction Data.
Michiel Sprik
Journal of Physics Condensed Matter
T. Schneider, E. Stoll
Physical Review B
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
A. Gangulee, F.M. D'Heurle
Thin Solid Films