Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
The Lorenz-polarization (LP) factor, which is used for X-ray intensity calculations from polycrystalline materials, contains a term that describes the fraction of diffracting grains in the irradiated sample volume. We present extensions of this term and a series of experiments that tests its applicability. The implications of the analysis on microbeam diffraction are also discussed. © 2004 International Centre for Diffraction Data.
T.N. Morgan
Semiconductor Science and Technology
J.A. Barker, D. Henderson, et al.
Molecular Physics
K.N. Tu
Materials Science and Engineering: A
P.C. Pattnaik, D.M. Newns
Physical Review B